Название |
Self-Organization upon The Formation of Oxides on Thin Tin Films |
Библиографический список |
1. A. M. Khoviv, I. N. Nazarenko, L. A. Malevskaya // Proc. of RAS. Inorganic materials. 1997. V. 157. No. 11. P. 1194–1199. 2. I. N. Nazarenko. Physicochemical model of semiconductor and metal oxidation. — Voronezh: Voronezh state technological academy. 1997. — 73 p. 3. S. M. Repinsky // Surface. 1995. No. 7/8. P. 12–19. 4. S. A. Kukushkin // SBP. 1995. V. 37. No. 7. P. 2127–2132. 5. S. A. Kukushkin // Tech. Physics J. 1995. V. 65. Is. 6. P. 169–175. 6. C. H. Shim, D. S. Lee, S. L. Hwang et al. // Sensors and Actuators. B : Chemical. 2002. V. 81. No. 2/3. P. 176–181. 7. L. Sangaletti, L. E. Depero, B. Allieri // J. Mater. Res. 1998. V. 13. No. 9. P. 2457–2460. 8. Yu. I. Uryvsky, K. A. Lavrentiev, A. N. Sedov et al. Modern problems of the ellipsometry: book of papers. – Novosibirsk : Science, 1980. P. 71–78. |